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January 25 2010 - expires (January 07 2011)

Nanosensor for measurement of complex surface geometry for scanning probe microscopy

Reference: 10 DE 1592 3G5Z

Profile Country of Origin: Germany lde.gif

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A German research institute active in metrology has developed a sensor with a specific form for the measurement of surfaces with characteristics like undercut structures or deep holes (large aspect ratio). Conventional sensors or optical processes are not applicable for the measurement of such complex surface geometries. The research institute is searching for licensees.

The newly developed nanosensor which is already in use at a German research institute, enables the user to measure complex surface geometries like undercut structures and deep holes. The body of the convex nanosensor which is produced with a reward oriented undercut is connected to a cantilever. The undercut enables the scanning of complex surface geometries. The sensor bodies can be produced by a specific wet-chemical process from materials with piezoelectronic properties. This kind of sensor enables the measurement of deformations of the spike and therefore the acting force. By attaching additional wires with connected electrostatic potentials to the sensor spike the roughness of scanned surface can also get inspected. Innovative Aspects: The sensor enables the scanning of complex structures with high aspect ratios, while conventional sensors or optical processes are not capable to measure such structures. The advantages of the undercut sensor are the capabilities to measure: - deep holes and undercut structures, - in drill holes and small tubes, - additionally the roughness of the surface, - the deformation of the sensor spike.

Stage of Development

Available for demonstration - field tested

Exploitation of RTD Results

None

IPR

Patent(s) granted

Company Details

Type: Research institute/University

Size: 250-500

Collaboration Type

  • License Agreement

- Type of partner sought: Industry - Specific area of activity of the partner: Sensor systems, scanning probe microscopy, nanotechnology. - Task to be performed: Use or market the offered solution as licensee.

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